The biennial international Joint Urban Remote Sensing Event (JURSE) will take place in Vannes, France. JURSE is a forum of excellence where researchers, practitioners and students present, share and discuss their latest findings and results.
This event is committed to introduce innovative methodologies and technological resources recently employed to investigate the manifold aspects of the urban environment through orbital and airborne remote sensing data.
Emerging topics like new methods for urban land cover and land use classification with detailed discrimination of urban targets, 3D modeling of urban buildings, forecast and impact assessment of natural and man-made hazards in urban areas, urban social studies, urban ecology, urban climatology as well as data fusion, algorithms and techniques for remotely sensed data interpretation, and multisource remote sensing data will be approached.
The objectives of JURSE 2019 are:
- gathering people coming from academia, industry, local and national/international agencies together to discuss topics related to remote sensing for urban monitoring;
- fostering the research and the applications of available data sets over urban areas, with a special consideration for high resolution satellite data and data fusion;
- providing new ideas for developing sensors and/or systems able to analyse and monitor urban areas;
- improving the knowledge and the know-how by means of the interaction of researchers coming from different communities (photogrammetry, signal processing, computer vision, geomatics, data science, town and regional planning, geology, hydrology, climatology, ecology, etc) in this truly interdisciplinary field.
The 2019 edition of the JURSE conference series is technical co-sponsored by IEEE GRSS and ISPRS, and will feature keynote lectures, oral and poster sessions, technical tutorials, doctoral pitches, hackathon, urban remote sensing contest, panel session, industrial exhibitions… See the technical program. A rich social program will also be offered to the conference attendees.
Selected papers will be considered for post-conference journal special issues.